• SENSOR & CONTROLS 21XX
Navigation : EXPO21XX News » Sensors » Baumer’s new LX series offers high-definition quality at high throughput

Baumer’s new LX series offers high-definition quality at high throughput

The CMOS cameras of the new LX series master precise inspection tasks at high throughput.Photo by Baumer Group International Sales

The CMOS cameras of the new LX series master precise inspection tasks at high throughput.
Photo by Baumer Group International Sales

New LX series further expands the Baumer portfolio with cameras featuring high-resolution CMOSIS sensors and Dual GigE interface. First models are available as of June. They are the ideal solution for applications with demanding requirements on high-definition quality in image acquisition at high throughput. The new LX series master such tasks with 8, 12 and 20 megapixel resolutions and the 240 MB/s bandwidth of Dual GigE interface.

8 and 12 megapixel models utilize the proven CMOSIS 5.5 µm pixel design. Thus the new LX technology easily upgrades existing CCD-based systems to provide such excellent sensitivity and high frame rates. Furthermore, the upgrade eliminates cost for new optics. Besides ultrahigh resolution, the 20 MP model with 6.4 µm pixel structure and extremely low noise of only 8 e- provides a very high dynamic range of 66 dB. Such excellent image quality allows for more precise and reliable image evaluation. All models ensure outstanding sensitivity for reliable image acquisition even in high-dynamic processes.

Thanks to standard-compliant Dual GigE interface, the smallest 20 MP GigE Vision camera currently available enables cost-efficient system integration. Compared to single GigE cameras, the 240 MB/s bandwidth provides twice the frame rate or half the transmission time. In the application, this will significantly speed up reaction or inspection times. The LX series adds a big plus on flexibility thanks to HDR (High Dynamic Range), Power over Ethernet (PoE), Multi/IO and modular lens mount. The cameras are predestined for demanding inspections of PCBs, semi-conductors, surfaces or in 2D/3D measuring technology.

For more information, please visit http://www.baumer.com.