Concentrating on being a reliable partner to its customers, and offering the latest innovations in technology, ICOS has become a world-wide industry standard for the visual inspection of semiconductor components, as well as the alignment of SMD devices during the PC board assembly. With the acquisition of Qtec in 1998, ICOS extends its product assortment into leadframe inspection and some automotive applications.
OEM's and end users
ICOS' unique and patented technology is selling for many years to Original Equipment Manufacturers (OEM's) and IC Manufacturers (End users) alike. The technology is unique in its compactness and ease-of-integration. ICOS has a 100% vertical integration in its whole product line. Its high speed vision boards are used in its system level OEM products, which in turn are used in its stand alone equipment for end users.
Since long, the end users appreciate the ICOS' advanced technology either as a stand alone version, or integrated on many of the worlds leading assembly and test equipment. Currently, ICOS sells about 50% of its systems to end users.
Truly global support
ICOS' sales is spread over the four major areas in the Semiconductor industry world-wide: USA, Europe, Japan and SEA.
Our branches in the USA, Japan, Hong Kong and Singapore are in constant contact with the head office in Heverlee near Leuven. Being a global company, ICOS has chosen to have its branches managed by local people, familiar with their customers' specific needs.
In addition to its network of carefully selected high quality representatives, ICOS has a unique team of its own product specialists. These are high level ICOS engineers located in Europe, USA, Japan, Hong Kong, Singapore, Korea and Taiwan. These well trained and flexible engineers have only one mission: supporting the customer with any technical issue. This is just one way in which ICOS strives very hard each day to be a long term partner for its customers.
ICOS was founded in 1982 as a spin-off of the Leuven University.

• Image prossesing system for optical 2D and 3D measurement