{"id":41373,"date":"2021-04-07T08:00:47","date_gmt":"2021-04-07T06:00:47","guid":{"rendered":"https:\/\/www.expo21xx.com\/news\/?p=41373"},"modified":"2021-03-24T12:36:30","modified_gmt":"2021-03-24T11:36:30","slug":"hamamatsu-photonics-phemos-x-c15765-01","status":"publish","type":"post","link":"https:\/\/www.expo21xx.com\/news\/hamamatsu-photonics-phemos-x-c15765-01\/","title":{"rendered":"Hamamatsu Photonics introduces its new PHEMOS-X C15765-01 semiconductor failure analysis system"},"content":{"rendered":"\n
\"\"
Semiconductor failure analysis system PHEMOS-X C15765-01
Photo by Hamamatsu Photonics Europe GmbH<\/i><\/figcaption><\/figure><\/div>\n\n\n\n

Hamamatsu Photonics has developed a new semiconductor failure analysis system called the \u201cPHEMOS-X C15765-01\u201d that in just a single unit utilizes visible to near-infrared light to analyze semiconductor defects. What makes this possible is a newly mounted multi-wavelength laser scanner that applies our unique in-house optical design technology. <\/p>\n\n\n\n

Efficiently utilizing multi-wavelength light allows high sensitivity and high resolution essential for localizing semiconductor failures and so will improve failure analysis efficiency in diverse semiconductor devices that will be in high demand, such as state-of-the-art semiconductor devices whose circuit line width keeps on shrinking as well as power semiconductors that control electrical power more efficiently than ordinary semiconductor devices. Sales of the PHEMOS-X start on Thursday, April 1, 2021 for both domestic and overseas semiconductor device manufacturers.<\/p>\n\n\n\n

For more information, please visit http:\/\/www.hamamatsu.com<\/a>.<\/p>\n","protected":false},"excerpt":{"rendered":"

Hamamatsu Photonics has developed a new semiconductor failure analysis system called the \u201cPHEMOS-X C15765-01\u201d that in just a single unit utilizes visible to near-infrared light to analyze semiconductor defects. What makes this […]<\/p>\n","protected":false},"author":9,"featured_media":41374,"comment_status":"closed","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[1106],"tags":[1191,154,728,592,379],"class_list":["post-41373","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-laser-optics","tag-analyzer","tag-infrared","tag-laser-applications","tag-optics","tag-semiconductor"],"yoast_head":"\nHamamatsu Photonics introduces its new PHEMOS-X C15765-01 semiconductor failure analysis system - EXPO21XX.com NEWS<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.expo21xx.com\/news\/hamamatsu-photonics-phemos-x-c15765-01\/\" \/>\n<meta name=\"twitter:label1\" content=\"Written by\" \/>\n\t<meta name=\"twitter:data1\" content=\"Kamil\" \/>\n\t<meta name=\"twitter:label2\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data2\" content=\"1 minute\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\/\/schema.org\",\"@graph\":[{\"@type\":\"WebPage\",\"@id\":\"https:\/\/www.expo21xx.com\/news\/hamamatsu-photonics-phemos-x-c15765-01\/\",\"url\":\"https:\/\/www.expo21xx.com\/news\/hamamatsu-photonics-phemos-x-c15765-01\/\",\"name\":\"Hamamatsu Photonics introduces its new PHEMOS-X C15765-01 semiconductor failure analysis system - 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