Nikon’s cutting-edge X-ray and CT systems empower customers with powerful 3D imaging for component analysis to meet immediate business needs and uncover new opportunities. Innovative in-house microfocus X-ray sources up to 450 kV enable detailed visualisation from tiny connectors to large castings. Nikon’s X-ray and CT solutions provide the insights and efficiency gains manufacturers seek, and flexible automation supports precise quality control across R&D, failure analysis, and manufacturing. With exceptional scan volume, resolution, and speed paired with unparalleled image quality and repeatability, Nikon’s systems reveal customer parts in new ways.
Nikon’s VOXLS 40 Series offers configurable X-ray and CT systems with large inspection envelopes supporting multiple sources and detectors to suit the most demanding inspection requirements.
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Automation ready, packaged in an efficient footprint and paired with source energies of 225 kV, 320 kV or 450 kV. Ideal solution for small- to mid-sized samples of low to high density.
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Versatile microfocus CT systems for high-resolution inspection in R&D and failure analysis of components ranging from tiny plastic connectors up to aluminium castings.
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Interactive radiography inspection or detailed CT scans of PCB boards, electronic components or small parts in a wide range of industries.
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The APDIS MV4x0 is the latest generation of Nikon’s Laser Radar, offering the smallest and most productive system ever produced
The ability to measure detail at distance, without the need for handheld probes, targets or surface preparation, means that Nikon’s APDIS Laser Radar is ideally suited to automating repetitive inspection tasks covering a huge range of manufacturing, industrial and research applications, including those that involve hard to reach features and are complex, delicate or labour intensive.
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The new APDIS Intelligent Quality Stations are the next-generation, fully-automated non-contact CMMs for body in white and components – designed with the automotive industry in mind.
With the ability to measure over six times faster than traditional CMMs, be installed on the shop floor, and enhanced by ease of programming, the APDIS IQ stations provide unparalleled productivity, flexibility and simplicity for a CMM system. Precision measurements of features can be made without adapters, probes or coatings to high accuracy and repeatability, allowing quality control feedback quickly and easily where it’s needed.
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The APDIS Gap & Flush System delivers a new approach to vehicle-on-wheels moving line quality inspection.
Panel and closure gap and flush can directly impact a customer’s perception of the quality of a vehicle and brand. Reliable measurement of these features allows process feedback and quality control, but needs to be done automatically and safely whilst the vehicle is moving. This is provided by the APDIS Gap & Flush system.
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The APDIS Laser Radar can be used across a wide range of automotive metrology and process control applications
The APDIS MV430E provides the fastest feature measurement of any Laser Radar to date, allowing inspection of critical features in the takt time of the line, or a sampling strategy to cover more features over a set of car bodies for true process control.
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The portability of handheld scanning systems enables fast, accurate measurement directly on the shop floor, making it ideal for one-off dimensional inspection.
Measure challenging materials with exceptional detail at high speed directly on the shop floor. Pairing the ModelMaker H120 laser scanner with the MCAx S range of precision portable CMM arms delivers unparalleled freedom to accurately investigate production quality in all industrial applications.
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CMM laser scanners make optimal use of a CMM’s ability to automate repetitive measurement tasks while maintaining maximum inspection accuracy.
The L100 laser scanner from Nikon is ideal for the inspection of components where productivity is key, without having to compromise on accuracy. It offers exceptional precision and delivers high levels of detail.
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The LC15Dx captures the smallest details with the highest accuracy, providing valuable capability for inspecting components ranging from small aerofoils to intricate sheet metal parts.
Thanks to custom-designed, top quality Nikon optics, the LC15Dx captures the smallest details with precision while maintaining speed and data quality. It does this by optimising the laser settings in real time to match the type and reflectivity of the material being inspected.
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The triple-laser XC65Dx cross scanner captures 3D features and surfaces in a single pass, greatly increasing scanning productivity.
From an individual part such as a car door to a fully assembled vehicle, the XC65Dx is the ideal scanner for inspecting geometric features and freeform surfaces. Productivity is greatly improved by reducing time spent on both programming and executing scan paths.
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The NEXIV VMZ-S series offers speed and accuracy where high throughput is critical.
The VMZ-S series provides three types of measuring envelope together with a range of high quality optics, complete with a TTL (through the lens) scanning laser as standard.
Capable of high-accuracy, high-speed measurement for fulfilling increasingly demanding inspection applications, the VMZ-S series is used in a wide range of industries.
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The iNEXIV VMA series is ideal for a wide variety of industrial inspection applications requiring both vision and tactile measuring.
The iNEXIV VMA series provides three types of measurement envelope together with wide field of view optics. These touch probe-ready systems are ideal for a wide variety of industrial measurement, inspection and quality control applications using both vision and tactile measurement.
The VMA series is optimised for speed and ease-of-use as well as repeatable, accurate measurement of a variety of different components.
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The NEXIV VMZ-S series offers speed and accuracy where high throughput is critical.
This measuring system incorporates confocal technology, brightfield imaging with a 15X zoom and laser auto focus. No matter what geometrical measurements are needed, whether 2D or 3D, inspection and evaluation is exceptionally fast and accurate.
Confocal optics enable a clear display and facilitate accurate detection of high contrast edges.
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The VMZ-H3030 is easy to use, fast and enables the most accurate measurements in the NEXIV series due to precise stage operation and the high-performance optics.
VMZ-H3030 provides a 300x300x150 mm (X,Y,Z) measuring envelope together with a range of high quality optics, complete with a TTL (through-the-lens) scanning laser as standard. The system is designed to provide the ultimate in high accuracy measurement.
Highest Accuracy using the NEXIV Series
Due to its unique design and construction, the VMZ-H achieves the highest accuracy within the NEXIV series.
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The software realises high accuracy, speed and usability, combining those attributes with valuable functions in a user-friendly GUI.
AutoMeasure is dimensional measurement software that is easy to use and logically configured to create measurement programs. AutoMeasure has advanced programming tools to tackle any measurement application and can be easily configured with a basic interface for operators on the shop floor.
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VMZ-NWL200 is an automatic wafer measuring system that integrates a video measuring system “NEXIV” and a wafer loader “NWL200”. NEXIV automatically performs high-speed, high-precision measurement of 6-inch or 8-inch wafers held in a carrier.
The NEXIV video measurement system, used extensively in the global semiconductor industry, has been integrated with Nikon’s proven NWL200 automatic wafer loading system.
The result is the VMZ-NWL200, an innovative measuring cell with excellent reliability and efficiency. In addition, specially developed software simplifies complex operations required for process control. High quality data is fed back faster to the production line, maximising yield.
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A set of precision and accurate manual measuring microscopes designed for all industrial measurement and image analysis applications, focusing particularly on repeatable data capture- all with an easy user workflow.
MM-400N and MM-800N Series microscopes operate within a digital control system, providing excellent measurement accuracy for industrial in-line and quality assurance applications. The instruments are ideal for inspecting, measuring and verifying both 2D and 3D features across a wide range of components.
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The V-20B is a floor-standing optical profile projector offering superb image quality and capable of precisely measuring a feature’s X-Y co-ordinates. The image of the sample is displayed on a 20” (500mm) screen, enabling accurate data capture from the stage.
The V-20B provides excellent measurement accuracy for a range of industrial in-line and quality assurance applications.
Inspect, measure and verify 2D and angular features across a wide range of manufactured components.
The floor-mounted profile projector provides accurate results due to the precision instrument’s robust construction, Nikon optics and coordinate measuring stages.
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The V-12B is a bench-top optical profile projector offering superb image quality to precisely measure a feature’s X-Y co-ordinates. The image of the sample is displayed on a 12” (305mm) screen, enabling accurate data capture from the stage.
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Applications include determining the precision and accuracy of rotary tables and dividing heads; checking deflection in components with small movements, including those made from very stiff materials; and use as a trusted comparator tool against a reference flat surface or a tilted angle block.
6B-LED and 6D-LED autocollimators provide brightfield or darkfield contrast for simultaneous measurements in two axes, enabling easy alignment and result generation.
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Three digital heads – MF-1001:100mm travel, MK-501:50mm travel and MH-12M:15mm travel, with two counters – MFC-200: 0.1µm minimum readable value and accuracy of 3µm and TC-200: 0.01µm minimum readable value and accuracy of 1µm (0.7µm for the MH-15M). Accuracy figures are at 20°C.
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Applications include determining the precision and accuracy of rotary tables and dividing heads; checking deflection in components with small movements, including those made from very stiff materials; and use as a trusted comparator tool against a reference flat surface or a tilted angle block.
6B-LED and 6D-LED autocollimators provide brightfield or darkfield contrast for simultaneous measurements in two axes, enabling easy alignment and result generation.
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The SMZ25 and SMZ18 stereo microscope zoom series offers outstanding image quality for both user observation and digital camera capture throughout the full magnification range.
Nikon’s SMZ25 and SMZ18 revolutionise stereo microscopy with exceptional image resolution and the unique provision of 25:1 and 18:1 zoom ratios respectively.
Applications range from routine inspection of critical components to research and development and failure analysis of innovative structures and devices.
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The SMZ1270 series exceeds the standard imaging requirements when studying features on minute objects. It is especially suitable for materials science, industrial manufacturing applications and in-line process control functions
Ideal for failure analysis studies, defining modes of failure and verifying solutions. Component surface examination, crack-detection, corrosion studies, composite materials, textiles, parts produced by machine tools for critical aerospace components or building and construction materials are all carried out easily.
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By expanding the magnification to an 8:1 zoom ratio (1x-8x), the SMZ800N provides ease of use and high definition imaging essential for electronic component inspection and failure analysis.
Ideal for failure analysis studies, defining modes of failure then verifying solutions. Component surface examination, crack-detection, corrosion studies, composite materials, textiles, parts produced by machine tools for critical aerospace components or building and construction materials are all carried out easily.
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The high zoom magnification range of 7.5:1 and super-long working distance of 115mm show why both the SMZ745T and SMZ745 stereo microscopes are so well suited to materials research and production line applications.
Ideal for failure analysis studies, defining modes of failure then verify solutions. Component surface examination, crack-detection, corrosion studies, composite materials, textiles, parts produced by machine tools for critical aerospace components or building and construction materials are all carried out easily.
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The SMZ445 and SMZ460 are ideal for production quality control functions for both routine and critical applications, for failure analysis to determine and predict modes of failure and to verify solutions.
The SMZ445 and SMZ460 models offer great optical performance in compact bodies enabling quality images for the user with superior flatness, all achieved from an optical design and high production quality standards applied to all Nikon’s stereo microscope zoom systems.
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The long established SMZ-2 model has been available since 1961. With a high and parfocal zoom range of 5:1 and circular disk zoom control ring, it remains a superb instrument.
Nikon’s SMZ-2 stereo microscope is ideal for failure analysis, defining modes of failure and verifying solutions. Component surface examination, crack detection and corrosion studies may be performed easily. The instrument is also well suited to examination of composite materials, textiles, parts produced by machine tools such as critical aerospace components, and building and construction materials.
A range of semiconductor microscopes ideal for inspection of integrated circuits (IC), flat panel displays (FPD), large scale integration (LSI) electronic devices and many more applications.
Superb Nikon CFI60-2 optics provide excellent images to both eyepieces and also to Nikon’s digital imaging cameras with analysis software. Combining these superior optics with an extraordinary illumination system delivers images of excellent contrast and resolution.
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A flexible, modular, upright microscope series for various episcopic optical contrast techniques (BF-DF-DIC-POL-Fluorescence-Interferometry), together with digital imaging accessories and large stage XY travels, ideal for semiconductor and material inspection activities.
Superb Nikon CFI60-2 optics provide excellent images to both eyepieces and to Nikon’s digital imaging cameras with analysis software. Thanks to the modular design, the universal microscope allows complementary optical contrast techniques on one microscope stand.
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The ECLIPSE LV100NDA and LV100ND series of flexible, modular, upright microscopes from Nikon is designed for episcopic and diascopic optical contrast techniques. The instruments can be supplied with digital imaging camera accessories and are ideal for material inspection in many industrial applications.
Superb Nikon CFI60-2 optics provide excellent images to both eyepieces and to Nikon’s digital imaging cameras with analysis software. The universal microscope design allows complementary optical contrast techniques together on one microscope stand thanks to a modular component programme.
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The Nikon ECLIPSE MA200 is a flexible, modular, inverted microscope of innovative box design for episcopic optical contrast inspection techniques in conjunction with digital imaging accessories. It is ideal for metallurgical material inspection in many industrial applications.
Superb Nikon CFI60-2 optics provide excellent images to both eyepieces and to Nikon’s digital imaging cameras with analysis software. The universal microscope design allows complementary optical contrast techniques together on one microscope stand thanks to a modular component programme.
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A flexible, compact, affordable, modular inverted microscope for episcopic optical contrast techniques. Together with digital imaging camera accessories, it is ideal for metallurgical material inspection in many industrial applications.
Superb Nikon CFI60-2 optics provide excellent images to both eyepieces and to the optional port on Nikon’s digital imaging cameras with analysis software. The microscope design allows complementary optical contrast techniques.
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A series of polarising microscopes used to observe the birefringent properties of anisotropic specimens by observing image contrast and colour changes. Nikon offers systems for both quantitative and qualitative studies.
Superb Nikon CFI60-POL optics provide excellent images to eyepieces and to Nikon’s digital cameras.
LV100N POL enables a range of studies from conoscopy to orthoscopy using a full range of dedicated accessories.
Ci-POL enables a range of studies on a compact microscope.
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Fully featured NWL200 series models support the full range of inspection requirements for 6-inch (150mm) and 8 inch (200mm) diameter semiconductor wafers using optical microscope or video measurement instruments e.g. Nikon NEXIV.
The NWL Series is a superb line-up of semiconductor wafer loaders from Nikon capable of transferring 6″ (150mm) and 8″ (200mm) diameter wafers down to a thickness of 100 microns (option) onto Nikon Eclipse L200N and LV150N microscopes or a NEXIV VMZ-S video measuring system.
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NIS Elements software manages Nikon Digital Sight cameras to capture the best images for processing. It organizes images, processes them logically and in a smooth workflow.
NIS-Elements is a fully featured imaging software solution for microscopy.
Fast, powerful imaging processing tools are available, such as for creating a mosaic or compound image from many separate images, e.g. following a long micro-crack on a sample surface from start to finish.
For industrial applications, Nikon offers NIS-Elements AR (Advanced Research), BR (Basic Research), D (Documentation), and L (for a tablet PC).
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