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Banner Engineering Introduces Versatile LED Indicator Lights

Banner Engineering, a leading provider of technology for process and industrial automation, today announced release of K30L2 and K50L2 seven-color indicator lights for use in any application requiring high-visibility status indication. K30L2 […]

Avantes announced AvaSoft 8.7.0 Release

Avantes announced the release of AvaSoft version 8.7.0. The Windows-based AvaSoft software gives offers a user-friendly interface for instrument control and user-definable data collection parameters. It allows users to display and export […]

SCHOTT presented new phosphate laser glass for high-power lasers

APG-760 phosphate laser glass is made for high-performance applications at 1.05 μm. The glass is available in various versions and can be flexibly adapted to the needs and requirements of applications. Dielectric […]

Teledyne DALSA’s new Calibir GX series LWIR cameras ideal for non-destructive testing applications

Teledyne DALSA, a Teledyne Technologies company and global leader in image sensing technology, launched its Calibir GX series of long wave infrared (LWIR) cameras for industrial vision applications. Built to achieve frame […]


Allied Vision’s new ALVIUM® vision processor technology features revolutionary proprietary system-on-chip design

Allied Vision introduces a new unique vision processor technology. The ALVIUM® technology consists in a proprietary chip design optimized for advanced digital imaging combined with a comprehensive image processing library (IPL). For […]


SCHOTT Eternaloc® Electrical Penetrations New Requirements of Innovative Twin High-Temperature Reactors

SCHOTT, a leading international technology group in the areas of specialty glass and glass-ceramics, is proud to announce a partnership with Chinergy Co., Ltd and Jiamusi Electric Machine Co., Ltd to help […]


Hexagon releases new Optiv Classic 8102 and Optiv Classic 12152 designed for large measurements of moulded parts

Hexagon Manufacturing Intelligence is expanding the vision product range with user-friendly and practice-oriented system solutions for the measurement of large or palletised 2D moulded parts. Series components with geometrically varied and strict-tolerance […]


FUJIFILM releases new telephoto zoom cinema lens

FUJIFILM Corporation releases the FUJINON MK50-135mm T2.9 (MK50-135mm) telephoto zoom cinema lens in July 2017. The MK50-135mm has a focal length of 50-135mm and can be combined with the FUJINON MK18-55mm T2.9 […]


Edmund Optics presents its new Flexible Longpass Filters

Edmund Optics (EO), the premier provider of optical components, introduces new Flexible Longpass Filters. These versatile cut-on filters offer deep blocking and excellent transmission over a large spectral range from 400-1600nm to […]


Teledyne DALSA’s new Linea™ 16k CLHS camera features advanced CMOS line scan technology

Teledyne DALSA, a Teledyne Technologies company and global leader in machine vision, announced the extension of its Linea family of low-cost, high-value line scan cameras with a new 16k CLHS model. The […]


Allied Vision showcased its new Manta G-895B and other vision technologies at the SEMICON 2017

Allied Vision has once again participated in SEMICON Southeast Asia, the region’s premier event for microelectronics design and manufacturing in Penang, Malaysia. Infrared imaging for wafer inspection Goldeye short-wave infrared (SWIR) cameras […]


Hexagon’s new coordinate measuring machine capables of simultaneous capture of multiple points

Hexagon Manufacturing Intelligence has released a new camera-based portable coordinate measuring machine (CMM) for highly precise shop-floor measurements. The AICON MoveInspect XR8 detects geometric conditions and changes in three dimensions to deliver […]


Edmund Optics launches new TECHSPEC® High Performance Fluorescence Dichroic Filters

Edmund Optics (EO), the premier provider of optical components, introduces new TECHSPEC® High Performance Fluorescence Dichroic Filters. These versatile filters have received special attention to surface flatness, transmitted wavefront and surface quality […]