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Hamamatsu Photonics launched its new MiNYTM PL inspection system

MiNYTM PL micro-LED PL inspection system C15740-01
Photo by Hamamatsu Photonics Europe GmbH

Hamamatsu Photonics has developed a system for high-speed inspection of micro-LEDs on wafers to detect abnormalities in their external appearance, intensity and wavelength of their light emissions. This inspection system utilizes a photoluminescence (PL) measurement technique that is based on its advanced image processing technology and a newly developed imaging module with its unique optical design technology. Hamamatsu Photonics calls this micro-LED PL inspection system the ‘MiNYTM PL’, type number C15740-01.

The MiNYTM PL makes fast pass/fail decisions when inspecting micro-LEDs, which will contribute to an increased product yield for use in display applications and will also help to increase the R&D efficiency of micro-LEDs. Furthermore, the MiNYTM PL will also streamline the 100 percent inspection process of micro-LEDs in future mass production lines. Sales of the MiNYTM PL started Monday March 8, 2021 to LED and display manufacturers in domestic and overseas markets.

For more information, please visit http://www.hamamatsu.com.