Hamamatsu Photonics introduces its new ODPL measurement system C15993-01

Hamamatsu Photonics has developed a GaN (gallium nitride) crystal evaluation system “ODPL (omnidirectional photoluminescence) measurement system C15993-01” that leverages ODPL spectroscopy along with its unique light detection technologies including optical design and data processing. This ODPL measurement system quantitatively evaluates the quality of GaN crystals that are currently drawing vast attention as a material for next-generation power semiconductors. This new system will prove a powerful tool for enhancing R&D efficiency to discover new ways to improve crystal quality.

Sales of this new ODPL measurement system started on Monday, August 2, 2021 for researchers at universities and semiconductor substrate manufacturers both in Japan and overseas.

For more information, please visit http://www.hamamatsu.com.