The new Vanta™ Element X-ray fluorescence (XRF) analyzer offers the essential features that the Vanta series is known for—speed, reliability, ruggedness, connectivity and smartphone-like ease of use—in a cost-effective model. Easy to learn, fast to use, and weighing a slim 2.9 lb. (1.32 kg), the Vanta Element analyzer is up to the challenge of all day, high-throughput testing.
The Vanta Element analyzer offers speed and ease of use in a variety of testing environments, including scrap recycling and metal manufacturing. Users can obtain clear material and grade ID in seconds and compare alloy grades on the instrument’s screen. With a dual-core processor and powered by Olympus’ proven Axon Technology™, the Vanta Element analyzer has the same high count rate and stability as the rest of the Vanta series for rapid sorting and a fast ROI.
Built for use in demanding environments, Vanta Element analyzers are IP54 rated for resistance to dust and moisture and constructed to pass a 4-foot drop test (MIL-STD-810G) to help keep users working in case of an accidental drop or impact. For additional protection, a stainless steel faceplate is paired with a thick (50 µm) Kapton® window that can be easily attached and removed for toolless window changes in the field. If users work in hot or cold environments, they can count on the Vanta Element analyzer to perform in temperatures from -10 °C to 45 °C (14 °F to 113 °F).
The analyzer’s ruggedness features are paired with optional wireless connectivity to connect to the Olympus Scientific Cloud™ for wireless data sharing and access to convenient fleet management tools, the Olympus mobile app or your network, helping future proof it for Industry 4.0. The analyzer also has a 1 GB microSD™ card for storing results and two USB ports for easy data export. For added flexibility, the Vanta Element analyzer is compatible with accessories including the Vanta field stand, soil foot, probe shield and holster.
For more information, please visit http://www.olympus-ims.com.