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Simply retrofitted reliability – New redundant micropulse transducers from Baluff
The new BTL 7 redundant micropulse transducer is a robust, contact-free, and absolute position measuring system that can be freely configured. Up to three independent measurement sections and three independent electronics modules […]

Nikon Metrology announces new metrology CT system
Nikon Metrology combines 50 years’ experience of Coordinate Measuring Machine (CMM) metrology with 25 years’ experience of X-ray Computed Tomography (CT) to develop a new “absolute accuracy” metrology CT system. MCT225 provides […]

New sensor allows fully automated surface finish measurement on CMMs
Renishaw has added a new probe option for its revolutionary REVO® five-axis measurement system, which for the first time, allows surface finish inspection to be fully integrated within CMM measurement routines. With […]